X-ray diffractometer

$X-ray diffractometer$

X-ray diffractometer

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X-ray diffractometer

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$X-ray diffractometer$

Артикул:

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Contents of the work:

Classic phase analysis with the highest detection speed and accuracy.
Definition and refinement of the parameters of the elementary cell.
Determination of phases by layers.
Microdiffraction.
Texture analysis, construction of pole figures.
Determination of stresses and crystallite sizes.
Analysis of thin and very thin films, multilayer coatings.
Analysis of epitaxial films, highly ordered structures, rocking curve analysis, construction of reciprocal space maps, assessment of structure perfection.
Analysis of single crystals.
Reflectometry, determination of layer thickness and density.
Analysis of nanoscale powders and materials.
Small-angle X-ray scattering (SAXS), analysis of the size distribution of nanoparticles.
In-plane diffraction.
Conducting research under extreme processing conditions.
Determination of phase transitions when changing the parameters of a crystalline nanostructure.
Cluster analysis.
Tomographic scanning, construction and display of 3D projections of the internal structure of substances (defectoscopy).

Result: Determination of phase and structural components of any materials.

Specifications

State

Worker (Main Corr., aud.102)

Manufacturer

Netherlands